Layer model approach to background correction in r.f.-GDOES
- Payling, R., Nelis, T., Aeberhard, M., Michler, J., Seris, P.
Rf-GDOES depth profiling analysis of a monolayer of thiourea adsorbed on copper
- Shimizu, K., Payling, R., Habazaki, H., Skeldon, P., Thompson, G. E.
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